{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,24]],"date-time":"2026-10-24T17:56:00Z","timestamp":1792864560033,"version":"4.5.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/cicc.2017.7993699","type":"proceedings-article","created":{"date-parts":[[2017,8,9]],"date-time":"2017-08-09T20:07:33Z","timestamp":1502309253000},"page":"1-4","source":"Crossref","is-referenced-by-count":10,"title":["A background calibrated 28GS\/s 8b interleaved SAR ADC in 28nm CMOS"],"prefix":"10.1109","author":[{"given":"M. Q.","family":"Le","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.","family":"Gorecki","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.","family":"Riani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J.","family":"Pernillo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Tan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"K.","family":"Gopalakrishnan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"B.","family":"Helal","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"P.","family":"Khandelwal","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C.","family":"Loi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"I.","family":"Quek","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"P.","family":"Wong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Buchwald","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573474"},{"key":"ref11","first-page":"89","article-title":"A 90GS\/s 8b 667mw 64x interleaved SAR ADC in 32nm digital SOI CMOS","author":"kull","year":"2014","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2519397"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PGEC.1964.263853"},{"key":"ref4","author":"murmann","year":"2015","journal-title":"ADC Performance Survey 1997–2013"},{"key":"ref3","first-page":"329","article-title":"A time-interleaved track hold in 0.13?m CMOS sub-sampling a 4-GHz signal with 43-dB SNDR","author":"louwsma","year":"2007","journal-title":"IEEE Custom Integrated Circuits Conference"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757478"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2015.7231250"},{"key":"ref8","article-title":"A 23mw 24GS\/s 6b time-interleaved hybrid two-step ADC in 28nm CMOS","author":"xu","year":"2016","journal-title":"VLSI Symp Dig Tech Papers"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2015.7231248"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433972"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417907"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417905"}],"event":{"name":"2017 IEEE Custom Integrated Circuits Conference (CICC)","location":"Austin, TX","start":{"date-parts":[[2017,4,30]]},"end":{"date-parts":[[2017,5,3]]}},"container-title":["2017 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7986634\/7993450\/07993699.pdf?arnumber=7993699","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,9,7]],"date-time":"2017-09-07T01:11:33Z","timestamp":1504746693000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7993699\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/cicc.2017.7993699","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}