{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T13:25:14Z","timestamp":1756992314751},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/cicc.2019.8780279","type":"proceedings-article","created":{"date-parts":[[2019,8,1]],"date-time":"2019-08-01T20:03:04Z","timestamp":1564689784000},"page":"1-4","source":"Crossref","is-referenced-by-count":4,"title":["A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing"],"prefix":"10.1109","author":[{"given":"Gyusung","family":"Park","sequence":"first","affiliation":[]},{"given":"Minsu","family":"Kim","sequence":"additional","affiliation":[]},{"given":"Nakul","family":"Pande","sequence":"additional","affiliation":[]},{"given":"Po-Wei","family":"Chiu","sequence":"additional","affiliation":[]},{"given":"Jeehwan","family":"Song","sequence":"additional","affiliation":[]},{"given":"Chris H.","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531944"},{"key":"ref3","article-title":"Understanding analog to digital converter specifications","author":"staller","year":"2005","journal-title":"Embedded Systems Design"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2015.7338417"},{"key":"ref2","article-title":"Measurement of high-speed ADCs","author":"kull","year":"2018","journal-title":"IEEE Custom Integrated Circuits Conference (CICC)"},{"key":"ref1","first-page":"378","article-title":"A 90GS\/s 8b 667mW 64× int erleaved SAR ADC in 32nm digital SOI CMOS","author":"kull","year":"2014","journal-title":"ISSCC Dig Tech Papers"}],"event":{"name":"2019 IEEE Custom Integrated Circuits Conference (CICC)","start":{"date-parts":[[2019,4,14]]},"location":"Austin, TX, USA","end":{"date-parts":[[2019,4,17]]}},"container-title":["2019 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8767369\/8780115\/08780279.pdf?arnumber=8780279","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:51:20Z","timestamp":1658141480000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8780279\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/cicc.2019.8780279","relation":{},"subject":[],"published":{"date-parts":[[2019,4]]}}}