{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:52:05Z","timestamp":1772121125063,"version":"3.50.1"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,1]],"date-time":"2023-04-01T00:00:00Z","timestamp":1680307200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4]]},"DOI":"10.1109\/cicc57935.2023.10121213","type":"proceedings-article","created":{"date-parts":[[2023,5,11]],"date-time":"2023-05-11T17:23:55Z","timestamp":1683825835000},"page":"1-2","source":"Crossref","is-referenced-by-count":10,"title":["DenseCIM: Binary Weighted-Capacitor SRAM Computation-In-Memory with Column-by-Column Dynamic Range Calibration SAR ADC"],"prefix":"10.1109","author":[{"given":"Yong-Jun","family":"Jo","sequence":"first","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]},{"given":"Boon Peng","family":"Yap","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]},{"given":"Dong-Hyun","family":"Yoon","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]},{"given":"Hyunjoon","family":"Kim","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]},{"given":"Yuanjin","family":"Zheng","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]},{"given":"Tony Tae-Hyoung","family":"Kim","sequence":"additional","affiliation":[{"name":"Nanyang Technological University,School of EEE,Singapore"}]}],"member":"263","reference":[{"key":"ref4","author":"yu","year":"2022","journal-title":"JSSC"},{"key":"ref3","author":"xie","year":"2021","journal-title":"ISSCC"},{"key":"ref5","author":"zhang","year":"2022","journal-title":"ASSCC"},{"key":"ref2","author":"chen","year":"2021","journal-title":"JSSC"},{"key":"ref1","author":"yan","year":"2022","journal-title":"ISSCC"}],"event":{"name":"2023 IEEE Custom Integrated Circuits Conference (CICC)","location":"San Antonio, TX, USA","start":{"date-parts":[[2023,4,23]]},"end":{"date-parts":[[2023,4,26]]}},"container-title":["2023 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10121189\/10121178\/10121213.pdf?arnumber=10121213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:51:30Z","timestamp":1686592290000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10121213\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/cicc57935.2023.10121213","relation":{},"subject":[],"published":{"date-parts":[[2023,4]]}}}