{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T03:13:47Z","timestamp":1778814827721,"version":"3.51.4"},"reference-count":0,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T00:00:00Z","timestamp":1776556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T00:00:00Z","timestamp":1776556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020487","name":"Nature","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020487","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,19]]},"DOI":"10.1109\/cicc65509.2026.11509574","type":"proceedings-article","created":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T02:52:39Z","timestamp":1778813559000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A 10GHz Double-Edge Sampling PLL with 12.8fs\n                    <sub>rms<\/sub>\n                    Jitter and -257.8dB FoM\n                    <sub>J<\/sub>\n                    in 65nm CMOS Process"],"prefix":"10.1109","author":[{"given":"Feng","family":"Bu","sequence":"first","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Depeng","family":"Sun","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ge","family":"Wang","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zonglin","family":"Li","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhou","family":"Shu","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bowen","family":"Wang","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Xu","sequence":"additional","affiliation":[{"name":"Fudan University,Institute of Microelectronics,Shanghai,China,200433"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Na","family":"Yan","sequence":"additional","affiliation":[{"name":"Fudan University,Institute of Microelectronics,Shanghai,China,200433"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruixue","family":"Ding","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shubin","family":"Liu","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhangming","family":"Zhu","sequence":"additional","affiliation":[{"name":"Xidian University,Hangzhou Institute of Technology,Hangzhou,China,311231"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"2026 IEEE Custom Integrated Circuits Conference (CICC)","location":"Seattle, WA, USA","start":{"date-parts":[[2026,4,19]]},"end":{"date-parts":[[2026,4,23]]}},"container-title":["2026 IEEE Custom Integrated Circuits Conference (CICC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11509458\/11509459\/11509574.pdf?arnumber=11509574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T02:52:47Z","timestamp":1778813567000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11509574\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,19]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/cicc65509.2026.11509574","relation":{},"subject":[],"published":{"date-parts":[[2026,4,19]]}}}