{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T19:29:58Z","timestamp":1725391798755},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/cist.2018.8596397","type":"proceedings-article","created":{"date-parts":[[2018,12,31]],"date-time":"2018-12-31T18:23:45Z","timestamp":1546280625000},"page":"64-69","source":"Crossref","is-referenced-by-count":1,"title":["Constraint Based Testing and Verification of Java Bytecode Programs"],"prefix":"10.1109","author":[{"given":"Safaa","family":"Achour","sequence":"first","affiliation":[]},{"given":"Mohammzed","family":"Benattou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"11","article-title":"Raisonnement contraintes pour le test de bytecode java","author":"charreteur","year":"2008","journal-title":"quatri&#x00E8;mes Journ&#x00E9;es Francophones de Programmation par Contraintes (JFPC'08)"},{"key":"ref11","first-page":"79","article-title":"JaBUTi: A Coverage Analysis Tool for Java Programs","author":"vincenzi","year":"2003","journal-title":"XVII SBES-Brazilian Symposium on Software Engineering (Tool Section)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-6875-1_26"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SERE.2014.24"},{"key":"ref14","first-page":"449","article-title":"Pit: A practical mutation testing tool for java (demo)","author":"coles","year":"2016","journal-title":"Proceedings of the25th International Symposium on Software Testing and Analysis ser ISSTA 2016"},{"key":"ref15","article-title":"Generating Test Data from OCL Specification","author":"benattou","year":"2002","journal-title":"Proc ECOOP Workshop Integration and Transformation of UML Models"},{"key":"ref16","first-page":"861","article-title":"Integrating Random Testing with Constraints for Improved Efficiency and Diversity","author":"cheon","year":"2008","journal-title":"Proceedings of SEKE 2008 The 20-th International Conference on Software Engineering and Knowledge Engineering"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/spe.597"},{"key":"ref18","first-page":"135","article-title":"Advanced Java Bytecode","author":"binder","year":"2007","journal-title":"PPPJ'07 Proceedings of the 5th International Symposium on Principles and Practice of Programming in Java"},{"key":"ref19","first-page":"1","author":"bruneton","year":"2011","journal-title":"ASM 4 0 A Java Bytecode Engineering Library"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/32.92910"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSTW.2011.30"},{"key":"ref6","first-page":"486","article-title":"Dependence analysis of Java bytecode","author":"zhao","year":"2000","journal-title":"IEEE Annual International Computer Software and Applications Conference"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/spe.726"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1858996.1859035"},{"key":"ref7","first-page":"206","article-title":"Generating control flow graph from Java card byte code","author":"achkar","year":"2014","journal-title":"Information Science and Technology (CIST) 2014 Third IEEE International Colloquium in"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4236\/jis.2013.42013"},{"key":"ref1","article-title":"Software testing research: achievements, chal-lenges, dreams","author":"bertolino","year":"2007","journal-title":"2007 Future of Software Engineering IEEE Computer Society"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.26"},{"key":"ref20","article-title":"Regression test selection for AspectJ software","author":"xu","year":"2007","journal-title":"Int Conf Software Engineering"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.IR.5737"}],"event":{"name":"2018 IEEE 5th International Congress on Information Science and Technology (CiSt)","start":{"date-parts":[[2018,10,21]]},"location":"Marrakech","end":{"date-parts":[[2018,10,27]]}},"container-title":["2018 IEEE 5th International Congress on Information Science and Technology (CiSt)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8575702\/8596320\/08596397.pdf?arnumber=8596397","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T11:13:44Z","timestamp":1643282024000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8596397\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/cist.2018.8596397","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}