{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:34:51Z","timestamp":1729611291392,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,9]]},"DOI":"10.1109\/coase.2007.4341705","type":"proceedings-article","created":{"date-parts":[[2007,10,9]],"date-time":"2007-10-09T17:45:29Z","timestamp":1191951929000},"page":"398-403","source":"Crossref","is-referenced-by-count":1,"title":["Approximate Analysis of Re-Entrant Lines with Bernoulli Reliability Models"],"prefix":"10.1109","author":[{"given":"Chong","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jingshan","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","first-page":"2003","article-title":"A Generalized Stochastic Petri Net Model for Performance Analysis and Control of Capacitated Reentrant Lines","volume":"20","author":"choi","year":"0","journal-title":"IEEE Transactions on Robotics and Automation"},{"doi-asserted-by":"publisher","key":"17","DOI":"10.1016\/j.cor.2004.09.014"},{"key":"18","doi-asserted-by":"crossref","first-page":"757","DOI":"10.1109\/3477.875450","article-title":"Markovian Timed Petri Nets for Performance Analysis of Semiconductor Manufacturing Systems","volume":"30","author":"jeng","year":"2000","journal-title":"IEEE Transactions on Systems Man and Cybernetics - Part B"},{"doi-asserted-by":"publisher","key":"15","DOI":"10.1007\/978-1-4612-2670-3_8"},{"doi-asserted-by":"publisher","key":"16","DOI":"10.1016\/0305-0548(95)00003-5"},{"key":"13","doi-asserted-by":"crossref","first-page":"119","DOI":"10.1080\/07408170208928855","article-title":"Using an Optimized Queueing Network Model to Support Wafer Fab Design","volume":"34","author":"hopp","year":"2002","journal-title":"IIE Transactions"},{"doi-asserted-by":"publisher","key":"14","DOI":"10.1007\/BF01158930"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/66.705370"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/70.964657"},{"year":"2007","author":"wang","article-title":"Approximate Analysis of Re-entrent Lines with Bernoulli reliability Machines","key":"21"},{"key":"3","first-page":"119","article-title":"Throughput Analysis of Production Systems: Research Topics from Automotive Industry Perspective","author":"li","year":"2007","journal-title":"Proceedings of 6th International Confoerene on Analysis of Manufacturing Systems"},{"key":"20","doi-asserted-by":"crossref","first-page":"755","DOI":"10.1080\/07408170490458553","article-title":"Performance Analysis of Production Systems with Rework Loops","volume":"36","author":"li","year":"2004","journal-title":"IIE Transactions"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1016\/0377-2217(95)00378-9"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1007\/BF01158636"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/37.334413"},{"year":"1994","author":"gershwin","journal-title":"Manufacturing Systems Engineering","key":"7"},{"year":"1993","author":"papadopoulos","journal-title":"Queueing Theory in Manufacturing Systems Analysis and Design","key":"6"},{"year":"1993","author":"buzacott","journal-title":"Stochastic Models of Manufacturing Systems","key":"5"},{"year":"1992","author":"viswanadham","journal-title":"Performance Modeling of Automated Manufacturing System","key":"4"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/66.4384"},{"year":"2007","author":"li","journal-title":"Production Systems Engineering","key":"8"}],"event":{"name":"2007 IEEE International Conference on Automation Science and Engineering","start":{"date-parts":[[2007,9,22]]},"location":"Scottsdale, AZ, USA","end":{"date-parts":[[2007,9,25]]}},"container-title":["2007 IEEE International Conference on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4341639\/4341640\/04341705.pdf?arnumber=4341705","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T23:46:27Z","timestamp":1497743187000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4341705\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/coase.2007.4341705","relation":{},"subject":[],"published":{"date-parts":[[2007,9]]}}}