{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:59:23Z","timestamp":1729663163069,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,9]]},"DOI":"10.1109\/coase.2007.4341712","type":"proceedings-article","created":{"date-parts":[[2007,10,9]],"date-time":"2007-10-09T13:45:29Z","timestamp":1191937529000},"page":"188-193","source":"Crossref","is-referenced-by-count":3,"title":["A Consolidated Approach to Minimize Semiconductor Production Loss Due to Unscheduled ATE Downtime"],"prefix":"10.1109","author":[{"given":"Tongdan","family":"Jin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fethi","family":"Belkhouche","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chen-Han","family":"Sung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"25","article-title":"Shrinking die, expanding test","volume":"7","author":"wilson","year":"2006","journal-title":"Semiconductor Manufacturing Magazine"},{"key":"2","article-title":"Inventory optimization for repairable products considering the increase of MTBF and field installation","author":"jin","year":"2007","journal-title":"IERC 2007"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743162"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/54.544538"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2004.831948"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2006.326904"},{"key":"5","doi-asserted-by":"crossref","first-page":"413","DOI":"10.1016\/j.ress.2005.02.004","article-title":"Maintenance resource optimization applied to a manufacturing system","volume":"91","author":"castro","year":"2006","journal-title":"Reliability Engineering and System Safety"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.1992.253824"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805620"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.2004.1321674"}],"event":{"name":"2007 IEEE International Conference on Automation Science and Engineering","start":{"date-parts":[[2007,9,22]]},"location":"Scottsdale, AZ, USA","end":{"date-parts":[[2007,9,25]]}},"container-title":["2007 IEEE International Conference on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4341639\/4341640\/04341712.pdf?arnumber=4341712","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,17]],"date-time":"2017-06-17T19:46:25Z","timestamp":1497728785000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4341712\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/coase.2007.4341712","relation":{},"subject":[],"published":{"date-parts":[[2007,9]]}}}