{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T13:40:11Z","timestamp":1730209211734,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,8]]},"DOI":"10.1109\/coase.2009.5234101","type":"proceedings-article","created":{"date-parts":[[2009,9,11]],"date-time":"2009-09-11T14:10:59Z","timestamp":1252678259000},"page":"427-432","source":"Crossref","is-referenced-by-count":0,"title":["A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services"],"prefix":"10.1109","author":[{"given":"Chih-Min","family":"Fan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yun-Pei","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/0304-4076(95)01763-1"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.2307\/2944713"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.2307\/2685045"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1080\/15459620802225481"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1007\/s11135-006-9018-6"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/WSC.2008.4736337"},{"journal-title":"The Statistical Sleuth A Course in Methods of Data Analysis","year":"1997","author":"ramsey","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1988.10478694"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.2307\/2290777"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.901398"},{"key":"2","first-page":"7","article-title":"emerging role for data mining","volume":"42","author":"killter","year":"1999","journal-title":"Solid State Technology"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IEMT.1996.559754"},{"key":"10","article-title":"data mining techniques for engineering data analysis: issues and solutions","author":"chen","year":"2002","journal-title":"International Symposium on Semiconductor Manufacturing"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2006.04.014"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2003.818959"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2005.852118"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2008.07.009"},{"key":"9","article-title":"data mining and fault diagnosis based on wafer acceptance test data","author":"guo","year":"2001","journal-title":"International Symposium on Semiconductor Manufacturing"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSM.2006.4493014"}],"event":{"name":"2009 IEEE International Conference on Automation Science and Engineering (CASE 2009)","start":{"date-parts":[[2009,8,22]]},"location":"Bangalore, India","end":{"date-parts":[[2009,8,25]]}},"container-title":["2009 IEEE International Conference on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5227795\/5234081\/05234101.pdf?arnumber=5234101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:58:08Z","timestamp":1489798688000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5234101\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,8]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/coase.2009.5234101","relation":{},"subject":[],"published":{"date-parts":[[2009,8]]}}}