{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,15]],"date-time":"2025-11-15T17:02:11Z","timestamp":1763226131207,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/coase.2013.6653936","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T17:22:15Z","timestamp":1384190535000},"page":"807-812","source":"Crossref","is-referenced-by-count":16,"title":["Fast image drift compensation in scanning electron microscope using image registration"],"prefix":"10.1109","author":[{"given":"Naresh","family":"Marturi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sounkalo","family":"Dembele","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nadine","family":"Piat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","first-page":"1","article-title":"Performance evaluation of scanning electron microscopes using signal-to-noise ratio","author":"marturi","year":"2012","journal-title":"International Workshop on Microfactories"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126544"},{"key":"12","volume":"2","author":"hartley","year":"2000","journal-title":"Multiple View Geometry in Computer Vision"},{"journal-title":"Accurate 3d Shape and Displacement Measurement Using A Scanning Electron Microscope","year":"2006","author":"cornille","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1142\/S0219878909001898"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-0215-9"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2005.104"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927610094250"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2007.915021"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1080\/15599612.2012.663462"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-007-9042-z"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2007.09.014"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1117\/1.JEI.21.3.033020"}],"event":{"name":"2013 IEEE International Conference on Automation Science and Engineering (CASE 2013)","start":{"date-parts":[[2013,8,17]]},"location":"Madison, WI, USA","end":{"date-parts":[[2013,8,20]]}},"container-title":["2013 IEEE International Conference on Automation Science and Engineering (CASE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6639384\/6653883\/06653936.pdf?arnumber=6653936","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:58:02Z","timestamp":1490219882000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6653936\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/coase.2013.6653936","relation":{},"subject":[],"published":{"date-parts":[[2013,8]]}}}