{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T06:05:50Z","timestamp":1762409150014,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,8]]},"DOI":"10.1109\/coase.2015.7294242","type":"proceedings-article","created":{"date-parts":[[2015,10,8]],"date-time":"2015-10-08T21:56:58Z","timestamp":1444341418000},"page":"1078-1083","source":"Crossref","is-referenced-by-count":7,"title":["Network models for monitoring high-dimensional image profiles"],"prefix":"10.1109","author":[{"given":"Chen","family":"Kan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"669","article-title":"Segmentation, Inference and Classification of Partially Overlapping Nanoparticles","volume":"35","author":"park","year":"2013","journal-title":"Pattern Analysis and Machine Intelligence IEEE Transactions on"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2015.1027455"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.888048"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0601602103"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nature03607"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.85.016101"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2001.937655"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/07408170600728913"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1198\/004017004000000455"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"199","DOI":"10.1080\/00224065.2006.11918610","article-title":"Phase I analysis for monitoring nonlinear profiles in manufacturing processes","volume":"38","author":"ding","year":"2006","journal-title":"Journal of Quality Technology"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/qre.788"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2013.770187"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2005.859655"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"418","DOI":"10.1080\/00224065.2000.11980027","article-title":"Online monitoring when the process yields a linear profile","volume":"32","author":"kang","year":"2000","journal-title":"Journal of Quality Technology"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1080\/00224065.2011.11917848","article-title":"A review and perspective on control charting with image data","volume":"43","author":"megahed","year":"2001","journal-title":"Journal of Quality Technology"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1287"}],"event":{"name":"2015 IEEE International Conference on Automation Science and Engineering (CASE)","start":{"date-parts":[[2015,8,24]]},"location":"Gothenburg, Sweden","end":{"date-parts":[[2015,8,28]]}},"container-title":["2015 IEEE International Conference on Automation Science and Engineering (CASE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7279855\/7294025\/07294242.pdf?arnumber=7294242","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,31]],"date-time":"2019-08-31T09:58:23Z","timestamp":1567245503000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7294242\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/coase.2015.7294242","relation":{},"subject":[],"published":{"date-parts":[[2015,8]]}}}