{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T14:02:34Z","timestamp":1730210554724,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007,4]]},"DOI":"10.1109\/cscwd.2007.4281583","type":"proceedings-article","created":{"date-parts":[[2007,8,8]],"date-time":"2007-08-08T11:59:31Z","timestamp":1186574371000},"page":"1044-1049","source":"Crossref","is-referenced-by-count":1,"title":["A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding"],"prefix":"10.1109","author":[{"given":"Wenfa","family":"Zhan","sequence":"first","affiliation":[]},{"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[]},{"given":"Feng","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.913754"},{"key":"ref11","first-page":"673","article-title":"Reduction of SOC test data volume, scan power and testing time using using alternating run-length codes","author":"chandra","year":"2002","journal-title":"Proceedings of IEEE\/ACM Design Automation Conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270870"},{"key":"ref13","first-page":"548","article-title":"Efficient test data compressionand decompression based on alternation and run length codes","volume":"27","author":"huaguo","year":"2004","journal-title":"Chinese Journal of Computers"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2002.1046192"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011117"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811451"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.844311"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.811452"},{"journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VISL Circuits","year":"2000","author":"agrawal","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855085"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998362"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.870861"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1992.224429"},{"key":"ref8","first-page":"462","article-title":"Emerging Techniques for Test Data Compression","author":"k j","year":"2005","journal-title":"Proc 14th IEEE Asian Test Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.30"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1223641"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/54.953275"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"}],"event":{"name":"2007 11th International Conference on Computer Supported Cooperative Work in Design","start":{"date-parts":[[2007,4,26]]},"location":"Melbourne, Australia","end":{"date-parts":[[2007,4,28]]}},"container-title":["2007 11th International Conference on Computer Supported Cooperative Work in Design"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4281389\/4281390\/04281583.pdf?arnumber=4281583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:00:08Z","timestamp":1489683608000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4281583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,4]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/cscwd.2007.4281583","relation":{},"subject":[],"published":{"date-parts":[[2007,4]]}}}