{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,20]],"date-time":"2024-09-20T16:40:40Z","timestamp":1726850440898},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,1]],"date-time":"2020-07-01T00:00:00Z","timestamp":1593561600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7]]},"DOI":"10.1109\/dac18072.2020.9218588","type":"proceedings-article","created":{"date-parts":[[2020,10,9]],"date-time":"2020-10-09T15:57:03Z","timestamp":1602259023000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["TEVoT: Timing Error Modeling of Functional Units under Dynamic Voltage and Temperature Variations"],"prefix":"10.1109","author":[{"given":"Xun","family":"Jiao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongning","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wanli","family":"Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"volume-title":"Amd app sdk v2.5","key":"ref1"},{"volume-title":"Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits.","year":"2004","author":"Bushnell","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372642"},{"journal-title":"DATE","article-title":"Exploiting dynamic timing margins in mi-croprocessors for frequency-over-scaling with instruction-based clock adjustment","year":"2015","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053964"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.44"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2150976.2151008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2005.09.012"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2223467"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2018.2889103"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203882"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2012.6237021"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/174130.174138"},{"key":"ref15","article-title":"Scikit-learn: Machine learning in python","author":"Pedregosa","year":"2011","journal-title":"Journal of machine learning research"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176659"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.342"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.72"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993518"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913186"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2038698.2038720"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744805"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2370816.2370865"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105401"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-9379-0_13"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155636"}],"event":{"name":"2020 57th ACM\/IEEE Design Automation Conference (DAC)","start":{"date-parts":[[2020,7,20]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2020,7,24]]}},"container-title":["2020 57th ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9211868\/9218488\/09218588.pdf?arnumber=9218588","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T19:54:44Z","timestamp":1706039684000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9218588\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/dac18072.2020.9218588","relation":{},"subject":[],"published":{"date-parts":[[2020,7]]}}}