{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,29]],"date-time":"2026-01-29T16:18:19Z","timestamp":1769703499230,"version":"3.49.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003711","name":"Ministry of Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003711","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,12,5]]},"DOI":"10.1109\/dac18074.2021.9586136","type":"proceedings-article","created":{"date-parts":[[2021,11,8]],"date-time":"2021-11-08T23:30:34Z","timestamp":1636414234000},"page":"895-900","source":"Crossref","is-referenced-by-count":12,"title":["Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation"],"prefix":"10.1109","author":[{"given":"Wenfei","family":"Hu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhikai","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sen","family":"Yin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zuochang","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yan","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","author":"sun","year":"2011","journal-title":"Particle Swarm Optimisation Classical and Quantum Perspectives"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2009.2014613"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/21.286385"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654259"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203773"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218602"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2212254"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.7873\/DATE2014.045"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"},{"key":"ref4","author":"mcconaghy","year":"2012","journal-title":"Variation-Aware Design of Custom Integrated Circuits A Hands-on Field Guide"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2292504"},{"key":"ref8","author":"price","year":"2006","journal-title":"Differential Evolution A Practical Approach to Global Optimization"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714879"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001370"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2404895"},{"key":"ref9","author":"m\u00fcller","year":"1999","journal-title":"Genetic Algorithms Concepts and Designs"},{"key":"ref20","first-page":"216","author":"keiter","year":"2017","journal-title":"Xyce Parallel Electronic Simulator User's Guide"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2284109"}],"event":{"name":"2021 58th ACM\/IEEE Design Automation Conference (DAC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2021,12,5]]},"end":{"date-parts":[[2021,12,9]]}},"container-title":["2021 58th ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9585997\/9586083\/09586136.pdf?arnumber=9586136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:51Z","timestamp":1652201751000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9586136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/dac18074.2021.9586136","relation":{},"subject":[],"published":{"date-parts":[[2021,12,5]]}}}