{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T16:30:31Z","timestamp":1783787431766,"version":"3.55.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,5]],"date-time":"2021-12-05T00:00:00Z","timestamp":1638662400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000185","name":"Defense Advanced Research Projects Agency","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000185","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000185","name":"Defense Advanced Research Projects Agency","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000185","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,12,5]]},"DOI":"10.1109\/dac18074.2021.9586289","type":"proceedings-article","created":{"date-parts":[[2021,11,8]],"date-time":"2021-11-08T23:30:34Z","timestamp":1636414234000},"page":"529-534","source":"Crossref","is-referenced-by-count":51,"title":["DirectFuzz: Automated Test Generation for RTL Designs using Directed Graybox Fuzzing"],"prefix":"10.1109","author":[{"given":"Sadullah","family":"Canakci","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Leila","family":"Delshadtehrani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Furkan","family":"Eris","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Michael Bedford","family":"Taylor","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Manuel","family":"Egele","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ajay","family":"Joshi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","first-page":"213","article-title":"Hardfails: Insights into software-exploitable hardware bugs","author":"dessouky","year":"2019","journal-title":"Usenix Security"},{"key":"ref11","year":"0","journal-title":"ekiwi\/rfuzz"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775907"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/2071356.2071363"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203780"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2015.7443099"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240842"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714989"},{"key":"ref18","year":"0","journal-title":"Microsoft"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.107"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342260"},{"key":"ref3","first-page":"185","article-title":"Quebs: Qualifying event based search in concolic testing for validation of rtl models","author":"ahmed","year":"2017","journal-title":"ICCD"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3134020"},{"key":"ref5","article-title":"Announcing oss-fuzz: Continuous fuzzing for open source software","author":"aizatsky","year":"2016","journal-title":"Google Testing Blog"},{"key":"ref8","author":"chen","year":"2012","journal-title":"System-LeveL Validation High-Level Modeling and Directed Test Generation Techniques"},{"key":"ref7","year":"2019","journal-title":"Jaspergold formal verification platform"},{"key":"ref2","year":"0","journal-title":"Verilator"},{"key":"ref1","year":"0","journal-title":"The Sodor processor educational microarchitectures for RISC-V ISA"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.49"},{"key":"ref20","year":"2020","journal-title":"sifive-blocks"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.14722\/ndss.2016.23368"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10710-005-2985-x"},{"key":"ref24","year":"0","journal-title":"ucb-art\/fft"},{"key":"ref23","year":"0","journal-title":"Synthesis Design Compiler"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.14722\/ndss.2019.23504"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065788"}],"event":{"name":"2021 58th ACM\/IEEE Design Automation Conference (DAC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2021,12,5]]},"end":{"date-parts":[[2021,12,9]]}},"container-title":["2021 58th ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9585997\/9586083\/09586289.pdf?arnumber=9586289","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:55:54Z","timestamp":1652201754000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9586289\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12,5]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/dac18074.2021.9586289","relation":{},"subject":[],"published":{"date-parts":[[2021,12,5]]}}}