{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T14:45:28Z","timestamp":1776955528510,"version":"3.51.4"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,9]],"date-time":"2023-07-09T00:00:00Z","timestamp":1688860800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,9]],"date-time":"2023-07-09T00:00:00Z","timestamp":1688860800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,9]]},"DOI":"10.1109\/dac56929.2023.10247670","type":"proceedings-article","created":{"date-parts":[[2023,9,15]],"date-time":"2023-09-15T17:31:31Z","timestamp":1694799091000},"page":"1-2","source":"Crossref","is-referenced-by-count":5,"title":["RQ-DNN: Reliable Quantization for Fault-tolerant Deep Neural Networks"],"prefix":"10.1109","author":[{"given":"Insu","family":"Choi","sequence":"first","affiliation":[{"name":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jae-Youn","family":"Hong","sequence":"additional","affiliation":[{"name":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"JaeHwa","family":"Jeon","sequence":"additional","affiliation":[{"name":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[{"name":"Yonsei University,Department of Electrical and Electronic Engineering,Seoul,South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3195997"},{"key":"ref3","first-page":"5308","article-title":"Robust quantization: One model to rule them all","volume":"33","author":"chmiel","year":"2020","journal-title":"Advances in neural information processing systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3477007"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774543"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317805"}],"event":{"name":"2023 60th ACM\/IEEE Design Automation Conference (DAC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2023,7,9]]},"end":{"date-parts":[[2023,7,13]]}},"container-title":["2023 60th ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10247654\/10247655\/10247670.pdf?arnumber=10247670","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,2]],"date-time":"2023-10-02T17:41:49Z","timestamp":1696268509000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10247670\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,9]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/dac56929.2023.10247670","relation":{},"subject":[],"published":{"date-parts":[[2023,7,9]]}}}