{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T08:01:09Z","timestamp":1767772869903,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,9]],"date-time":"2023-07-09T00:00:00Z","timestamp":1688860800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,9]],"date-time":"2023-07-09T00:00:00Z","timestamp":1688860800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,9]]},"DOI":"10.1109\/dac56929.2023.10247692","type":"proceedings-article","created":{"date-parts":[[2023,9,15]],"date-time":"2023-09-15T17:31:31Z","timestamp":1694799091000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["UpTime: Towards Flow-based In-Memory Computing with High Fault-Tolerance"],"prefix":"10.1109","author":[{"given":"Sven","family":"Thijssen","sequence":"first","affiliation":[{"name":"University of Central Florida,Department of Computer Science,Orlando,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad Rashedul","family":"Haq Rashed","sequence":"additional","affiliation":[{"name":"University of Central Florida,Department of Electrical and Computer Engineering,Orlando,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sumit","family":"Kumar Jha","sequence":"additional","affiliation":[{"name":"University of Central Florida,Department of Computer Science,Orlando,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rickard","family":"Ewetz","sequence":"additional","affiliation":[{"name":"University of Texas at San Antonio,Department of Computer Science,San Antonio,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","first-page":"199","article-title":"Efficient error-correcting-code mechanism for high-throughput memristive processing-inmemory","author":"leitersdorf","year":"2021","journal-title":"DAC"},{"key":"ref12","first-page":"2054","article-title":"Memristor-based material implication (imply) logic: Design principles and methodologies","volume":"22","author":"kvatinsky","year":"2013","journal-title":"VLSI"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624687"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0002-z"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2357292"},{"key":"ref10","first-page":"1733","article-title":"Cost-and dataset-free stuck-at fault mitigation for reram-based deep learning accelerators","author":"jung","year":"2021","journal-title":"DATE"},{"key":"ref2","first-page":"11","article-title":"A 30 year retrospective on dennard’s mosfet scaling paper","volume":"12","author":"bohr","year":"2007","journal-title":"IEEE SSCS Newsletter"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/359576.359579"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1038\/s41565-020-0655-z"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD51958.2021.9643526"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9473995"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/abb842"},{"key":"ref24","first-page":"102","article-title":"Stuck-at fault tolerance in rram computing systems","volume":"8","author":"xia","year":"2017","journal-title":"JETCAS"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062248"},{"key":"ref26","first-page":"1","article-title":"Towards resilient deployment of in-memory neural networks with high throughput","author":"zhang","year":"2020","journal-title":"DAC’21"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2491680"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2922889"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MCSE.2017.31"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISMVL.2008.43"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287707"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-23180-2"},{"key":"ref7","first-page":"326","article-title":"Rxnn: A framework for evaluating deep neural networks on resistive crossbars","volume":"40","author":"jain","year":"2020","journal-title":"TCAD"},{"key":"ref9","article-title":"Computation of boolean formulas using sneak paths in crossbar computing","author":"jha","year":"2016","journal-title":"US Patent"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3453688.3461746"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927093"},{"key":"ref6","first-page":"256","article-title":"Design of ion-implanted mosfet’s with very small physical dimensions","volume":"9","author":"dennard","year":"1974","journal-title":"JSSC"},{"key":"ref5","first-page":"180","article-title":"Rram defect modeling and failure analysis based on march test and a novel squeeze-search scheme","volume":"64","author":"chen","year":"2014","journal-title":"TC"}],"event":{"name":"2023 60th ACM\/IEEE Design Automation Conference (DAC)","start":{"date-parts":[[2023,7,9]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2023,7,13]]}},"container-title":["2023 60th ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10247654\/10247655\/10247692.pdf?arnumber=10247692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,2]],"date-time":"2023-10-02T17:41:25Z","timestamp":1696268485000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10247692\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,9]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/dac56929.2023.10247692","relation":{},"subject":[],"published":{"date-parts":[[2023,7,9]]}}}