{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T18:32:21Z","timestamp":1769538741375,"version":"3.49.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,22]]},"DOI":"10.1109\/dac63849.2025.11132095","type":"proceedings-article","created":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:35:41Z","timestamp":1757957741000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Machine Learning-Driven STL Generation for Enhancing Functional Safety of E\/E Systems"],"prefix":"10.1109","author":[{"given":"Sanjay","family":"Das","sequence":"first","affiliation":[{"name":"University of Texas at Dallas,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Swastik","family":"Bhattacharya","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anand","family":"Menon","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shamik","family":"Kundu","sequence":"additional","affiliation":[{"name":"Intel Corporation,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pooja","family":"Madhusoodhanan","sequence":"additional","affiliation":[{"name":"Texas Instruments,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prasanth Viswanathan","family":"Pillai","sequence":"additional","affiliation":[{"name":"Texas Instruments,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rubin","family":"Parekhji","sequence":"additional","affiliation":[{"name":"Texas Instruments,Bangalore,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arnab","family":"Raha","sequence":"additional","affiliation":[{"name":"Intel Corporation,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suvadeep","family":"Banerjee","sequence":"additional","affiliation":[{"name":"Intel Corporation,CA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suriyaprakash","family":"Natarajan","sequence":"additional","affiliation":[{"name":"Siemens EDA,OR,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kanad","family":"Basu","sequence":"additional","affiliation":[{"name":"University of Texas at Dallas,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2011.0251"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9474128"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-97-8043-3_195"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3334273"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3075429"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3649329.3656498"},{"key":"ref7","first-page":"3","article-title":"Introduction to iec 61508","volume-title":"Acm international conference proceeding series","volume":"162","author":"Bell"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2018.8357065"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2017.8046235"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5196022"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3268210"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS52814.2021.9486711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSP.2017.8286506"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app11209476"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714780"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2018.8357281"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-70679-1_5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.24963\/ijcai.2021\/362"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1613\/jair.301"},{"key":"ref20","first-page":"2024","article-title":"Xcelium fault simulator","year":"2024"},{"key":"ref21","article-title":"Verilator 4.0: open simulation goes multithreaded","volume-title":"Open Source Digital Design Conference (ORConf)","author":"Snyder"}],"event":{"name":"2025 62nd ACM\/IEEE Design Automation Conference (DAC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2025,6,22]]},"end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 62nd ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11132383\/11132091\/11132095.pdf?arnumber=11132095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T04:45:18Z","timestamp":1769489118000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11132095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,22]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/dac63849.2025.11132095","relation":{},"subject":[],"published":{"date-parts":[[2025,6,22]]}}}