{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T06:12:07Z","timestamp":1758089527165,"version":"3.44.0"},"reference-count":33,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,22]]},"DOI":"10.1109\/dac63849.2025.11132540","type":"proceedings-article","created":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:35:41Z","timestamp":1757957741000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["EPIC: Error PredIction and Correction for Power-Efficient Voltage Underscaling Multiply-Accumulate Unit"],"prefix":"10.1109","author":[{"given":"Tongjing","family":"Wu","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaolu","family":"Hu","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tong","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siting","family":"Liu","sequence":"additional","affiliation":[{"name":"ShanghaiTech University,School of Information Science and Technology,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weifeng","family":"He","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhigang","family":"Mao","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Honglan","family":"Jiang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3084827"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/app12188972"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3365742"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.122666"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"article-title":"Full stack optimization of transformer inference: a survey","year":"2023","author":"Kim","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD50377.2020.00036"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546701"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3233923"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2034764"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2841824"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/isca.2016.32"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465918"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2758793"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2011.2159285"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770804"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247879"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3106858"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.2985057"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3041517"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2019.2933862"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LSSC.2020.3006626"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2022.3220525"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2023.3347469"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3094923"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"year":"2024","key":"ref27","article-title":"DesignWare DW02_mult"},{"year":"2024","key":"ref28","article-title":"DesignWare DW01_add"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2948164"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/IACIS61494.2024.10721962"},{"article-title":"Mnist handwritten digit database","year":"2010","author":"LeCun","key":"ref31"},{"key":"ref32","article-title":"Fashion-mnist: a novel image dataset for benchmarking machine learning algorithms","author":"Xiao","year":"2017","journal-title":"arXiv preprint arXiv:1708.07747"},{"year":"2021","key":"ref33","article-title":"Reuters-21578 dataset"}],"event":{"name":"2025 62nd ACM\/IEEE Design Automation Conference (DAC)","start":{"date-parts":[[2025,6,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 62nd ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11132383\/11132091\/11132540.pdf?arnumber=11132540","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T05:52:46Z","timestamp":1758001966000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11132540\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,22]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/dac63849.2025.11132540","relation":{},"subject":[],"published":{"date-parts":[[2025,6,22]]}}}