{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:07:56Z","timestamp":1781885276048,"version":"3.54.5"},"reference-count":43,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,22]]},"DOI":"10.1109\/dac63849.2025.11132928","type":"proceedings-article","created":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:35:41Z","timestamp":1757957741000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["EPICS: Efficient Parallel Pattern Fault Simulation for Sequential Circuits via Strongly Connected Components"],"prefix":"10.1109","author":[{"given":"Mingjun","family":"Wang","sequence":"first","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hui","family":"Wang","sequence":"additional","affiliation":[{"name":"CASTEST Co., Ltd"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianan","family":"Mu","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinyu","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bin","family":"Sun","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yihan","family":"Wen","sequence":"additional","affiliation":[{"name":"Beijing University of Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zizhen","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feng","family":"Gu","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun","family":"Gao","sequence":"additional","affiliation":[{"name":"CASTEST Co., Ltd"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shengwen","family":"Liang","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Ye","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Huawei","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MITS.2019.2953543"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-64218-5_44"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2019.2908643"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3603287.3651203"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.4271\/2017-01-0015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-12-370597-6.x5000-8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/0471457787"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/amr.753-755.2235"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-011-4366-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia62534.2024.10661312"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.215006"},{"key":"ref12","article-title":"Elec 7250 sequential parallel fault simulator","author":"Maddela"},{"key":"ref13","first-page":"128","article-title":"Concurrent fault simulation and functional level modeling","volume-title":"Proceedings of the 14th Design Automation Conference","author":"Abramovici"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1991.185327"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/43.124398"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/43.536711"},{"key":"ref17","article-title":"TestMAX ATPG and TestMAX Diagnosis User Guide, Synopsys","year":"2021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/12.54847"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061131"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/238793.238847"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/math12111723"},{"key":"ref23","volume-title":"Fast timing simulation of MOS VLSI circuits. University of Illinois at Urbana-Champaign","author":"Overhauser","year":"1989"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1137\/0201010"},{"key":"ref25","article-title":"Data structures and algorithms. Addison-wesley Boston","volume":"175","author":"Hopcroft"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-30820-8_22"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40888-5_6"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/iciev.2012.6317462"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-009-1417-9_3"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1989.203434"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1993.580022"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.223820"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512641"},{"issue":"4","key":"ref34","first-page":"300","article-title":"Efficient single fault propagation in combinational circuits","volume":"29","author":"Harel","year":"1986","journal-title":"Communications of the ACM"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/bf00134691"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/MIXDES.2018.8436880"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1997.568183"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/iccad.1991.185328"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850649"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/54.75660"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1023\/a:1008376522451"},{"key":"ref42","year":"2023","journal-title":"copyright 2023 Synopsys, Inc"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"key":"ref44","article-title":"OpenXuantie","year":"2021"}],"event":{"name":"2025 62nd ACM\/IEEE Design Automation Conference (DAC)","location":"San Francisco, CA, USA","start":{"date-parts":[[2025,6,22]]},"end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 62nd ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11132383\/11132091\/11132928.pdf?arnumber=11132928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T05:24:33Z","timestamp":1758000273000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11132928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,22]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/dac63849.2025.11132928","relation":{},"subject":[],"published":{"date-parts":[[2025,6,22]]}}}