{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T06:11:06Z","timestamp":1758089466353,"version":"3.44.0"},"reference-count":38,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,22]]},"DOI":"10.1109\/dac63849.2025.11133280","type":"proceedings-article","created":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:35:41Z","timestamp":1757957741000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["Location is Key: Leveraging LLM for Functional Bug Localization in Verilog Design"],"prefix":"10.1109","author":[{"given":"Bingkun","family":"Yao","sequence":"first","affiliation":[{"name":"City University of Hong Kong"}]},{"given":"Ning","family":"Wang","sequence":"additional","affiliation":[{"name":"City University of Hong Kong"}]},{"given":"Jie","family":"Zhou","sequence":"additional","affiliation":[{"name":"Southeast University"}]},{"given":"Xi","family":"Wang","sequence":"additional","affiliation":[{"name":"Southeast University"}]},{"given":"Hong","family":"Gao","sequence":"additional","affiliation":[{"name":"Zhejiang Normal University"}]},{"given":"Zhe","family":"Jiang","sequence":"additional","affiliation":[{"name":"Southeast University"}]},{"given":"Nan","family":"Guan","sequence":"additional","affiliation":[{"name":"City University of Hong Kong"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD56317.2022.00085"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-024-2622-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2016.14"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3166114"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD56317.2022.00092"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2023.3269899"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3660526"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546890"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3341750"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2024.3368208"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SP46215.2023.10179420"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3660773"},{"article-title":"Deepseek-coder-v2: Breaking the barrier of closed-source models in code intelligence","year":"2024","author":"DeepSeek-AI","key":"ref13"},{"article-title":"Training a helpful and harmless assistant with reinforcement learning from human feedback","year":"2022","author":"J","key":"ref14"},{"journal-title":"IEEE ICCAD 2024, to appear","article-title":"Meic: Re-thinking rtl debug automation using llms","author":"Xu","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3643681"},{"key":"ref17","article-title":"Opencores"},{"journal-title":"ICLR 2022","article-title":"LoRA: Low-rank adaptation of large language models","author":"Hu","key":"ref18"},{"key":"ref19","first-page":"40 145","article-title":"BetterV: Controlled verilog generation with discriminative guidance","volume":"235","author":"Pei","journal-title":"ACM ICML 2024"},{"article-title":"Continual pre-training of large language models: How to (re)warm your model?","year":"2023","author":"Gupta","key":"ref20"},{"article-title":"Codesearchnet challenge: Evaluating the state of semantic code search","year":"2020","author":"Husain","key":"ref21"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SEQUEN.1997.666900"},{"article-title":"A survey on locality sensitive hashing algorithms and their applications","year":"2021","author":"Jafari","key":"ref23"},{"key":"ref24","first-page":"24824","article-title":"Chain-of-thought prompting elicits reasoning in large language models","volume":"35","author":"Wei","journal-title":"NeurIPS 2022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1370750.1370761"},{"article-title":"Simpo: Simple preference optimization with a reference-free reward","year":"2024","author":"Meng","key":"ref26"},{"article-title":"Attention is all you need","year":"2023","author":"Vaswani","key":"ref27"},{"key":"ref28","article-title":"Bradley-terry model"},{"article-title":"Evaluating large language models trained on code","year":"2021","author":"Chen","key":"ref29"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2024.3483089"},{"key":"ref31","doi-asserted-by":"crossref","DOI":"10.1145\/3649329.3657353","article-title":"Rtlfixer: Automatically fixing rtl syntax errors with large language models","author":"Tsai","year":"2024"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323812"},{"article-title":"Large language model for verilog generation with golden code feedback","year":"2024","author":"Ning","key":"ref33"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137086"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473904"},{"article-title":"Towards llm-powered verilog rtl assistant: Self-verification and self-correction","year":"2024","author":"Huang","key":"ref36"},{"article-title":"Hdldebugger: Streamlining hdl debugging with large language models","year":"2024","author":"Yao","key":"ref37"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473927"}],"event":{"name":"2025 62nd ACM\/IEEE Design Automation Conference (DAC)","start":{"date-parts":[[2025,6,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 62nd ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11132383\/11132091\/11133280.pdf?arnumber=11133280","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T05:25:17Z","timestamp":1758000317000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11133280\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,22]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/dac63849.2025.11133280","relation":{},"subject":[],"published":{"date-parts":[[2025,6,22]]}}}