{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T06:13:15Z","timestamp":1758089595052,"version":"3.44.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,22]],"date-time":"2025-06-22T00:00:00Z","timestamp":1750550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,6,22]]},"DOI":"10.1109\/dac63849.2025.11133380","type":"proceedings-article","created":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:35:41Z","timestamp":1757957741000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Delving into Topology Representation for Layout Pattern: A Novel Contrastive Learning Framework for Hotspot Detection"],"prefix":"10.1109","author":[{"given":"Silin","family":"Chen","sequence":"first","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}]},{"given":"Kangjian","family":"Di","sequence":"additional","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}]},{"given":"Guohao","family":"Wang","sequence":"additional","affiliation":[{"name":"ZetaTech Co.,Ltd."}]},{"given":"Wenzheng","family":"Zhao","sequence":"additional","affiliation":[{"name":"ZetaTech Co.,Ltd."}]},{"given":"Li","family":"Du","sequence":"additional","affiliation":[{"name":"Nanjing University,School of Electronic Science and Engineering,Nanjing,China"}]},{"given":"Ningmu","family":"Zou","sequence":"additional","affiliation":[{"name":"Nanjing University,School of Integrated Circuits,Suzhou,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2917849"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/12.2514818"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10248009"},{"key":"ref4","article-title":"Patternpaint: Generating layout patterns using generative ai and inpainting techniques","author":"Zhou","year":"2024","journal-title":"arXiv preprint arXiv:2409.01348"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137142"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586273"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.927765"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774579"},{"key":"ref9","first-page":"1","article-title":"Layoutransformer: Generating layout patterns with transformer via sequential pattern modeling","volume-title":"Proceedings of the 41st IEEE\/ACM international conference on computer-aided design","author":"Wen"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3112637"},{"key":"ref11","first-page":"8748","article-title":"Learning transferable visual models from natural language supervision","volume-title":"International conference on machine learning","author":"Radford"},{"key":"ref12","article-title":"An image is worth 16 16 words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2020","journal-title":"arXiv preprint arXiv:2010.11929"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1962.1057692"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3517130"},{"key":"ref15","first-page":"349","article-title":"Iccad-2012 cad contest in fuzzy pattern matching for physical verification and benchmark suite","volume-title":"Proceedings of the International Conference on Computer-Aided Design","author":"Torres"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2980073"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD45719.2019.8942128"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3015918"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3649476.3658707"}],"event":{"name":"2025 62nd ACM\/IEEE Design Automation Conference (DAC)","start":{"date-parts":[[2025,6,22]]},"location":"San Francisco, CA, USA","end":{"date-parts":[[2025,6,25]]}},"container-title":["2025 62nd ACM\/IEEE Design Automation Conference (DAC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11132383\/11132091\/11133380.pdf?arnumber=11133380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T05:46:52Z","timestamp":1758001612000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11133380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6,22]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/dac63849.2025.11133380","relation":{},"subject":[],"published":{"date-parts":[[2025,6,22]]}}}