{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T15:40:38Z","timestamp":1729611638380,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2003.1186390","type":"proceedings-article","created":{"date-parts":[[2003,12,22]],"date-time":"2003-12-22T12:34:10Z","timestamp":1072096450000},"page":"224-229","source":"Crossref","is-referenced-by-count":0,"title":["EBIST: a novel test generator with built-in fault detection capability"],"prefix":"10.1109","author":[{"given":"D.K.","family":"Pradhan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Chunsheng Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Chakraborty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.527990"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674762"},{"key":"6","doi-asserted-by":"crossref","DOI":"10.1049\/el:19850046","article-title":"Group parity prediction scheme for concurrent testing","volume":"21","author":"vasanthavada","year":"1985","journal-title":"Electronics Letters"},{"key":"5","first-page":"311","article-title":"Autonomous linear feedback shift register with on-line fault-detection","volume":"12","author":"wang","year":"1982","journal-title":"Proc of FTCS"},{"key":"4","article-title":"Shift registers designed for on-line fault detection","volume":"8","author":"pradhan","year":"1978","journal-title":"Proc of FTCS"}],"event":{"name":"6th Design Automation and Test in Europe (DATE 03)","acronym":"DATE-03","location":"Munich, Germany"},"container-title":["2003 Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8443\/26600\/01186390.pdf?arnumber=1186390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:57:44Z","timestamp":1497567464000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1186390\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/date.2003.1186390","relation":{},"subject":[]}}