{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:25:33Z","timestamp":1725535533439},"reference-count":0,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2003.1253579","type":"proceedings-article","created":{"date-parts":[[2005,4,12]],"date-time":"2005-04-12T14:25:04Z","timestamp":1113315904000},"page":"8-8","source":"Crossref","is-referenced-by-count":0,"title":["Semiconductor challenges"],"prefix":"10.1109","author":[{"given":"A.","family":"Cuomo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":"6th Design Automation and Test in Europe (DATE 03)","acronym":"DATE-03","location":"Munich, Germany"},"container-title":["2003 Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8443\/26600\/01253579.pdf?arnumber=1253579","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T22:53:27Z","timestamp":1489445607000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1253579\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/date.2003.1253579","relation":{},"subject":[]}}