{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T02:49:51Z","timestamp":1725418191600},"reference-count":0,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2004.1268818","type":"proceedings-article","created":{"date-parts":[[2004,6,21]],"date-time":"2004-06-21T17:52:40Z","timestamp":1087840360000},"page":"2","source":"Crossref","is-referenced-by-count":2,"title":["Opportunities and challenges in building silicon products in 65nm and beyond"],"prefix":"10.1109","author":[{"given":"G.S.","family":"Spirakis","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","event":{"name":". Design, Automation and Test in Europe Conference and Exhibition","acronym":"DATE-04","location":"Paris, France"},"container-title":["Proceedings Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8959\/28390\/01268818.pdf?arnumber=1268818","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T12:46:26Z","timestamp":1489409186000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1268818\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/date.2004.1268818","relation":{},"subject":[]}}