{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:09:58Z","timestamp":1742396998365},"reference-count":17,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2004.1268881","type":"proceedings-article","created":{"date-parts":[[2004,6,21]],"date-time":"2004-06-21T17:52:40Z","timestamp":1087840360000},"page":"410-415","source":"Crossref","is-referenced-by-count":5,"title":["Synchro-tokens: eliminating nondeterminism to enable chip-level test of globally-asynchronous SoC's"],"prefix":"10.1109","author":[{"given":"M.W.","family":"Heath","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.P.","family":"Burleson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.G.","family":"Harris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1991.176536"},{"key":"15","article-title":"Developing standard cells for tsmc 0. 25um technology under mosis deep rules","author":"sulistyo","year":"2002","journal-title":"Department of ECE Virginia Tech"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1023\/A:1014916913577"},{"key":"13","first-page":"38","article-title":"Implementing a STARI Chip","author":"greenstreet","year":"0","journal-title":"Proc IEEE ICC 1995"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743190"},{"journal-title":"Globally-Asynchronous Locally-Synchronous Systems","year":"1984","author":"chapiro","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/4.509852"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.2002.1000308"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743146"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.2000.836791"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1997.621501"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/12.599904"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/12.2252"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894239"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/92.805755"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1049\/ip-e.1986.0006"}],"event":{"name":". Design, Automation and Test in Europe Conference and Exhibition","acronym":"DATE-04","location":"Paris, France"},"container-title":["Proceedings Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8959\/28390\/01268881.pdf?arnumber=1268881","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,13]],"date-time":"2017-03-13T12:39:30Z","timestamp":1489408770000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1268881\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/date.2004.1268881","relation":{},"subject":[]}}