{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:35:49Z","timestamp":1725701749348},"reference-count":12,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2004.1268981","type":"proceedings-article","created":{"date-parts":[[2004,7,20]],"date-time":"2004-07-20T14:08:28Z","timestamp":1090332508000},"page":"810-815","source":"Crossref","is-referenced-by-count":15,"title":["Impact of test point insertion on silicon area and timing during layout"],"prefix":"10.1109","author":[{"given":"H.","family":"Vranken","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.S.","family":"Sapei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.-J.","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894217"},{"key":"2","first-page":"506","author":"cheng","year":"1995","journal-title":"Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST Proc Int Test Conf IEEE"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557122"},{"key":"1","first-page":"1929","author":"brglez","year":"1989","journal-title":"Combinational Profiles of Sequential Benchmark Circuits Proc Int Symp on Circuits and Systems IEEE"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270348"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"5","first-page":"1002","article-title":"An Effort-Minimized Logic BIST Implementation Method","author":"gu","year":"2001","journal-title":"Proc Int Test Conf IEEE"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041754"},{"key":"9","first-page":"253","article-title":"Test Point Insertion for Scan-Based BIST","author":"seiss","year":"1991","journal-title":"Proc European Test Conf"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894214"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597195"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2002.1029646"}],"event":{"name":"Design, Automation and Test in Europe Conference and Exhibition","acronym":"DATE-04","location":"Paris, France"},"container-title":["Proceedings Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8959\/28391\/01268981.pdf?arnumber=1268981","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T02:01:49Z","timestamp":1489456909000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1268981\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2004.1268981","relation":{},"subject":[]}}