{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T04:01:40Z","timestamp":1725422500786},"reference-count":1,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2004.1269106","type":"proceedings-article","created":{"date-parts":[[2004,7,20]],"date-time":"2004-07-20T14:08:28Z","timestamp":1090332508000},"page":"1400-1401","source":"Crossref","is-referenced-by-count":1,"title":["Realizable reduction for electromagnetically coupled RLMC interconnects"],"prefix":"10.1109","author":[{"family":"Rong Jiang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.C.-P.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"1","article-title":"Chen. Realizable reduction for electromagnetically coupled rlmc interconnects","author":"jiang","year":"0","journal-title":"EDA Group University of Wisconsin Madison"}],"event":{"name":"Design, Automation and Test in Europe Conference and Exhibition","acronym":"DATE-04","location":"Paris, France"},"container-title":["Proceedings Design, Automation and Test in Europe Conference and Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8959\/28391\/01269106.pdf?arnumber=1269106","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T01:54:26Z","timestamp":1489456466000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1269106\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":1,"URL":"https:\/\/doi.org\/10.1109\/date.2004.1269106","relation":{},"subject":[]}}