{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:16:33Z","timestamp":1725488193696},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/date.2005.256","type":"proceedings-article","created":{"date-parts":[[2005,4,1]],"date-time":"2005-04-01T15:16:50Z","timestamp":1112368610000},"page":"986-987","source":"Crossref","is-referenced-by-count":0,"title":["Reduction of CMOS Power Consumption and Signal Integrity Issues by Routing Optimization"],"prefix":"10.1109","author":[{"given":"P.","family":"Zuber","sequence":"first","affiliation":[]},{"given":"A.","family":"Windschieg","sequence":"additional","affiliation":[]},{"given":"R.","family":"Medina Beltan de Otalora","sequence":"additional","affiliation":[]},{"given":"W.","family":"Stechele","sequence":"additional","affiliation":[]},{"given":"A.","family":"Herkersdorf","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5685-5"},{"key":"2","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1145\/277044.277119","article-title":"Generic global placement and floorplanning","author":"eisenmann","year":"1998","journal-title":"Proceedings 1998 Design and Automation Conference 35th DAC (Cat No 98CH36175) DAC"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-2325-3"},{"journal-title":"International Technology Roadmap for Semiconductors","year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/764808.764859"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/5.920580"},{"journal-title":"A Geometric Programming Solver COPL_GP","year":"0","key":"4"},{"journal-title":"Net Ordering in Combination with Wire Spacing for Reduced Cmos Power Consumption","year":"2004","author":"zuber","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45716-X_6"}],"event":{"name":"Design, Automation and Test in Europe","location":"Munich, Germany"},"container-title":["Design, Automation and Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9609\/30361\/01395717.pdf?arnumber=1395717","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T13:53:36Z","timestamp":1497621216000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1395717\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2005.256","relation":{},"subject":[]}}