{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T17:01:15Z","timestamp":1725555675344},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/date.2008.4484722","type":"proceedings-article","created":{"date-parts":[[2008,4,15]],"date-time":"2008-04-15T22:15:51Z","timestamp":1208297751000},"page":"450-455","source":"Crossref","is-referenced-by-count":5,"title":["Vectorization of Reed Solomon Decoding and Mapping on the EVP"],"prefix":"10.1109","author":[{"given":"Akash","family":"Kumar","sequence":"first","affiliation":[]},{"given":"Kees","family":"van Berkel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2005.1599906"},{"journal-title":"Theory and Practice of Error Control Codes","year":"1983","author":"blahut","key":"2"},{"year":"0","key":"10"},{"journal-title":"Reed Solomon Codes and Their Applications","year":"1994","author":"wicker","key":"1"},{"journal-title":"Reed Solomon Decoder TMS320C64x Implementation Texas Instruments Inc SPRA686","year":"2000","author":"sankaran","key":"7"},{"key":"6","article-title":"comparison of arithmetic architectures for reed-solomon decoders in reconfigurable hardware","author":"paar","year":"1997","journal-title":"IEEE Symposium on FPGAs for Custom Computing Machines"},{"year":"0","key":"5"},{"year":"0","key":"4"},{"journal-title":"A fast parallel Reed-Solomon decoder onareconfigurable architecture CODES + ISSS","year":"2003","author":"koohi","key":"9"},{"journal-title":"Reed Solomon Decoding on the StarCore Processor Motorola Semiconductors Inc AN1841\/D","year":"2000","author":"taipale","key":"8"}],"event":{"name":"2008 Design, Automation and Test in Europe","start":{"date-parts":[[2008,3,10]]},"location":"Munich, Germany","end":{"date-parts":[[2008,3,14]]}},"container-title":["2008 Design, Automation and Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4475437\/4484624\/04484722.pdf?arnumber=4484722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T15:49:08Z","timestamp":1489679348000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4484722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/date.2008.4484722","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}