{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:24:11Z","timestamp":1725560651078},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/date.2008.4484724","type":"proceedings-article","created":{"date-parts":[[2008,4,15]],"date-time":"2008-04-15T18:15:51Z","timestamp":1208283351000},"page":"462-467","source":"Crossref","is-referenced-by-count":8,"title":["Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction"],"prefix":"10.1109","author":[{"given":"Anshuman","family":"Chandra","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felix","family":"Ng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rohit","family":"Kapur","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1145\/343647.343901"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/TEST.2001.966687"},{"doi-asserted-by":"publisher","key":"10","DOI":"10.1109\/TCAD.2002.807895"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/VTEST.2000.843824"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/TEST.1999.805616"},{"year":"0","key":"6"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/VTS.2001.923456"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/TEST.2000.894297"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/DAC.1997.597219"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/VTEST.1999.766696"},{"doi-asserted-by":"publisher","key":"11","DOI":"10.1109\/MDT.2006.105"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1109\/DATE.2002.998300"}],"event":{"name":"2008 Design, Automation and Test in Europe","start":{"date-parts":[[2008,3,10]]},"location":"Munich, Germany","end":{"date-parts":[[2008,3,14]]}},"container-title":["2008 Design, Automation and Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4475437\/4484624\/04484724.pdf?arnumber=4484724","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T17:47:46Z","timestamp":1489686466000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4484724\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2008.4484724","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}