{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T22:28:08Z","timestamp":1725661688145},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/date.2008.4484788","type":"proceedings-article","created":{"date-parts":[[2008,4,15]],"date-time":"2008-04-15T22:15:51Z","timestamp":1208297751000},"page":"897-902","source":"Crossref","is-referenced-by-count":5,"title":["A low-cost concurrent error detection technique for processor control logic"],"prefix":"10.1109","author":[{"given":"Ramtilak","family":"Vemu","sequence":"first","affiliation":[]},{"given":"Abhijit","family":"Jas","sequence":"additional","affiliation":[]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[]},{"given":"Srinivas","family":"Patil","sequence":"additional","affiliation":[]},{"given":"Rajesh","family":"Galivanche","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1991.139977"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2002.1181681"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008344603814"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.21840"},{"year":"0","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315626"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/54.587743"},{"journal-title":"Error Detection Logic for Digital Computers","year":"1968","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/43.644041"}],"event":{"name":"2008 Design, Automation and Test in Europe","start":{"date-parts":[[2008,3,10]]},"location":"Munich, Germany","end":{"date-parts":[[2008,3,14]]}},"container-title":["2008 Design, Automation and Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4475437\/4484624\/04484788.pdf?arnumber=4484788","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T21:42:52Z","timestamp":1489700572000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4484788\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2008.4484788","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}