{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:08:09Z","timestamp":1729616889013,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,3]]},"DOI":"10.1109\/date.2008.4484919","type":"proceedings-article","created":{"date-parts":[[2008,4,15]],"date-time":"2008-04-15T22:15:51Z","timestamp":1208297751000},"page":"1079-1082","source":"Crossref","is-referenced-by-count":4,"title":["Error Detection\/Correction in DNA Algorithmic Self-Assembly"],"prefix":"10.1109","author":[{"given":"Stephen","family":"Frechette","sequence":"first","affiliation":[]},{"given":"Fabrizio","family":"Lombardi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"21","author":"winfree","year":"2005","journal-title":"Self-Healing Tile Sets Foundations of Nanoscience Self-Assembled Architectures and Devices"},{"article-title":"simulations of computing by self-assembly","year":"0","author":"winfree","key":"2"},{"journal-title":"The Xgrow Simulator","year":"0","author":"winfree","key":"1"},{"key":"7","article-title":"compact error-resilient computational dna tiling assemblies","author":"reif","year":"2004","journal-title":"Lecture Notes in Computer Science"},{"key":"6","article-title":"self-correcting self-assembly: growth models and the hammersley process","author":"baryshnikov","year":"2005","journal-title":"Proc of the 11th Int'l Meeting on DNA Computing"},{"key":"5","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1007\/978-3-540-24628-2_11","article-title":"self-assembled circuit patterns","volume":"9","author":"cook","year":"2004","journal-title":"DNA Based Computers"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pbio.0020424"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.202418299"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1038\/415062a"}],"event":{"name":"2008 Design, Automation and Test in Europe","start":{"date-parts":[[2008,3,10]]},"location":"Munich, Germany","end":{"date-parts":[[2008,3,14]]}},"container-title":["2008 Design, Automation and Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4475437\/4484624\/04484919.pdf?arnumber=4484919","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T06:56:01Z","timestamp":1497768961000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4484919\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2008.4484919","relation":{},"subject":[],"published":{"date-parts":[[2008,3]]}}}