{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:48:41Z","timestamp":1764841721135},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,4]]},"DOI":"10.1109\/date.2009.5090714","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:39Z","timestamp":1361279799000},"page":"490-495","source":"Crossref","is-referenced-by-count":11,"title":["Improving yield and reliability of chip multiprocessors"],"prefix":"10.1109","author":[{"given":"A.","family":"Pan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"O.","family":"Khan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Kundu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"0","key":"19"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/5.705525"},{"key":"18","article-title":"exploring salvage techniques for multi-core architectures","author":"joseph","year":"2006","journal-title":"HPCRI-2005 Workshop in Conjunction With HPCA-2005"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.76"},{"key":"16","doi-asserted-by":"crossref","first-page":"503","DOI":"10.1145\/977091.977161","article-title":"opportunities and challenges in application-tuned circuits and architectures based on nanodevices","author":"wang","year":"2004","journal-title":"Proceedings of the 1st International Conference on Computing Frontiers"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2005.1452230"},{"key":"14","doi-asserted-by":"crossref","DOI":"10.1109\/DATE.2004.1268819","article-title":"fine-grained dynamic voltage and frequency scaling for precise energy and performance trade-off based on the ratio of off-chip access to on-chip computation times","author":"choi","year":"2004","journal-title":"Proc of Design Automation and Test in Europe"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0265"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311888"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1147\/rd.461.0077"},{"key":"20","first-page":"520","article-title":"exploiting structural duplication for lifetime reliability enhancement","author":"srinivasan","year":"2005","journal-title":"Computer Architecture 2005 ISCA '05 Proceedings 32nd International Symposium on"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1147\/rd.461.0005"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/12.237727"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/12.338099"},{"year":"0","key":"25"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311876"},{"year":"0","key":"27"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1999.809458"},{"year":"0","key":"29"},{"key":"3","article-title":"circuit failure prediction to overcome scaled cmos reliability challenges","author":"mitra","year":"2007","journal-title":"International Test Conference"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/1168918.1168868"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1999.761593"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2005.193914"},{"key":"7","first-page":"671","article-title":"towards achieving relentless reliability gains in a server marketplace of teraflops, laptops, kilowatts, & \"cost, cost, cost\" ... (making peace between a black art and the bottom line)","author":"van horn","year":"2005","journal-title":"Proc Intl Test Conf"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584030"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.840856"},{"year":"0","key":"8"}],"event":{"name":"2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09)","start":{"date-parts":[[2009,4,20]]},"location":"Nice","end":{"date-parts":[[2009,4,24]]}},"container-title":["2009 Design, Automation & Test in Europe Conference & Exhibition"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4926138\/5090609\/05090714.pdf?arnumber=5090714","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,2,8]],"date-time":"2022-02-08T19:02:51Z","timestamp":1644346971000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5090714"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,4]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/date.2009.5090714","relation":{},"subject":[],"published":{"date-parts":[[2009,4]]}}}