{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T14:52:24Z","timestamp":1761663144904},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5456958","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1011-1016","source":"Crossref","is-referenced-by-count":74,"title":["A resilience roadmap"],"prefix":"10.1109","author":[{"given":"Sani R","family":"Nassif","sequence":"first","affiliation":[]},{"given":"Nikil","family":"Mehta","sequence":"additional","affiliation":[]},{"family":"Yu Cao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391698"},{"journal-title":"Analog Design Centering and Sizing","year":"2007","author":"graeb","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0255"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.753687"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2009.5280814"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229436"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382553"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630013"},{"year":"0","key":"ref1","article-title":"Predictive technology model (ptm)"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05456958.pdf?arnumber=5456958","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T15:22:33Z","timestamp":1489850553000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5456958\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5456958","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}