{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:48:22Z","timestamp":1759146502559},"reference-count":38,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5456961","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1029-1034","source":"Crossref","is-referenced-by-count":25,"title":["Cross-layer resilience challenges: Metrics and optimization"],"prefix":"10.1109","author":[{"given":"Subhasish","family":"Mitra","sequence":"first","affiliation":[]},{"given":"Kevin","family":"Brelsford","sequence":"additional","affiliation":[]},{"given":"Pia N","family":"Sanda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.887832"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2007.21"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/12.980007"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364490"},{"key":"ref36","doi-asserted-by":"crossref","DOI":"10.1201\/9781439863961","author":"siewiorek","year":"1998","journal-title":"Reliable Computer Systems Design and Evaluation"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364501"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1147\/rd.435.0863"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/12.559803"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700583"},{"article-title":"Exascale Computing Study: Technology Challenges in Achieving Exascale Systems","year":"2008","author":"kogge","key":"ref14"},{"key":"ref15","article-title":"LEAP: Layout Design through Error-Aware Placement for Soft-Error Resilient Sequential Cell Design","author":"lee","year":"2010","journal-title":"Proc IEEE Intl Reliability Physics Symp"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457059"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.152"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687436"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456958"},{"key":"ref4","first-page":"12","article-title":"Non-Stop Advanced Architecture","author":"bernick","year":"2005","journal-title":"Proc IEEE Intl Conf Dependable Systems and Networks"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488799"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700614"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456959"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456960"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818146"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref20","article-title":"Concurrent Autonomous Self-Test for Uncore Components in SoCs","author":"li","year":"2010","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.859577"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/2.56855"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894311"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457140"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484801"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05456961.pdf?arnumber=5456961","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,9]],"date-time":"2019-07-09T18:18:44Z","timestamp":1562696324000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5456961\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5456961","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}