{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:04:54Z","timestamp":1725433494177},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5456984","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1165-1170","source":"Crossref","is-referenced-by-count":0,"title":["Properties of and improvements to time-domain dynamic thermal analysis algorithms"],"prefix":"10.1109","author":[{"family":"Xi Chen","sequence":"first","affiliation":[]},{"given":"Robert P","family":"Dick","sequence":"additional","affiliation":[]},{"family":"Li Shang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"article-title":"Numerical Recipes in FORTRAN: The Art of Scientific Computing","year":"1992","author":"press","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882589"},{"article-title":"Scientific Computing: An Introductory Survey","year":"2001","author":"heath","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898718027"},{"article-title":"The SPICE3 implementation guide","year":"1989","author":"quarles","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2002.995695"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859620"},{"article-title":"ISAC2: Incremental self-adaptive chip-package thermal analysis software, version 2","year":"0","author":"allec","key":"ref9"},{"key":"ref1","article-title":"Fast thermal simulation for architecture level dynamic thermal management","author":"liu","year":"2005","journal-title":"Proc Int Conf Computer-Aided Design"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05456984.pdf?arnumber=5456984","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T22:33:51Z","timestamp":1489876431000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5456984\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5456984","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}