{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:53:17Z","timestamp":1747806797093},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5456998","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:33Z","timestamp":1361297793000},"page":"1249-1254","source":"Crossref","is-referenced-by-count":9,"title":["Algorithms to maximize yield and enhance yield\/area of pipeline circuitry by insertion of switches and redundant modules"],"prefix":"10.1109","author":[{"given":"Mohammad","family":"Mirza-Aghatabar","sequence":"first","affiliation":[]},{"given":"Melvin A","family":"Breuer","sequence":"additional","affiliation":[]},{"given":"Sandeep K","family":"Gupta","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"A stage-level recovery scheme in scalable pipeline modules for high dependability","author":"yao","year":"2009","journal-title":"Innovative Architecture for Future Generation High-Performance Processors and Systems"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1991.199948"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1988.14729"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ARRAYS.1988.18100"},{"year":"2009","key":"ref14","article-title":"OpenSPARC"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.19"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.40"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2.56854"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.338099"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1454115.1454124"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICWSI.1992.171793"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/2.976918"},{"key":"ref1","article-title":"Systematic mechanisms limited yield (SMLY) study","author":"leachman","year":"2003","journal-title":"International SEMATECH DOC #03034383A-ENG"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675498"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05456998.pdf?arnumber=5456998","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T02:21:41Z","timestamp":1489890101000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5456998\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5456998","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}