{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:43:33Z","timestamp":1725450213332},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457000","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:33Z","timestamp":1361297793000},"page":"1261-1266","source":"Crossref","is-referenced-by-count":0,"title":["Behavioral level dual-v<inf>th<\/inf> design for reduced leakage power with thermal awareness"],"prefix":"10.1109","author":[{"family":"Junbo Yu","sequence":"first","affiliation":[]},{"family":"Qiang Zhou","sequence":"additional","affiliation":[]},{"family":"Gang Qu","sequence":"additional","affiliation":[]},{"family":"Jinian Bian","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681590"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2006.320049"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1996.545678"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052773"},{"key":"ref14","article-title":"Temperature-aware resource allocation and binding in behavioral synthesis","author":"mukherjee","year":"2005","journal-title":"Proc Design Automation Conference"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147028"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.886408"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217502"},{"key":"ref18","first-page":"8","article-title":"Corner Block List: An Effective and Efficient Topological Representation of Non-slicing Floorplan","author":"hong","year":"2000","journal-title":"Proceeding of ICCAD"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243742"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2002.808436"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/505388.505396"},{"key":"ref6","article-title":"HotLeakage: A Temperature-Aware Model of Subthreshold and Gate Leakage for Architects","author":"zhang","year":"2003","journal-title":"Univ of Virginia Dept of Computer Science Technical Report CS-2003-05"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065634"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1119772.1119851"},{"key":"ref7","article-title":"Standy and Active Leakage Current Control and Minimization in CMOS VLSI Circuits","author":"fallah","year":"2005","journal-title":"IEICE Trans on Electronics Special Section on Low-Power LSI and Low-Power IP"},{"year":"0","key":"ref2"},{"journal-title":"Leakage Power at 90nm and Below","year":"2005","author":"pangrle","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863747"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/871506.871529"},{"key":"ref21","article-title":"Cell-level placement for improving substrate thermal distribution","author":"tsai","year":"2000","journal-title":"IEEE Trans on Computer-Aided Design"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457000.pdf?arnumber=5457000","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,19]],"date-time":"2017-03-19T02:21:42Z","timestamp":1489890102000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457000\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457000","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}