{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:04:21Z","timestamp":1761581061600},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457036","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1426-1431","source":"Crossref","is-referenced-by-count":13,"title":["High-quality pattern selection for screening small-delay defects considering process variations and crosstalk"],"prefix":"10.1109","author":[{"family":"Ke Peng","sequence":"first","affiliation":[]},{"given":"Mahmut","family":"Yilmaz","sequence":"additional","affiliation":[]},{"given":"Mohammad","family":"Tehranipoor","sequence":"additional","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"A New Statistical Approach to Timing Analysis of VLSI Circuits","author":"lin","year":"1997","journal-title":"IEEE DAC2001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387378"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/92.894166"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.28"},{"key":"ref14","first-page":"566","article-title":"False-Path-Aware Statistical Timing Analysis and Efficient Path Selection for Delay Testing and Timing Validation","author":"lion","year":"2002","journal-title":"Proc Design Automation Conf (DAC '02)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.54"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207761"},{"article-title":"Digital Integrated Circuits, A Design Perspective","year":"2003","author":"rabaey","key":"ref17"},{"article-title":"Theory of Probability and Random Processes","year":"0","author":"koralov","key":"ref18"},{"year":"0","key":"ref19","article-title":"ITRS 2008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387328"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146993"},{"journal-title":"Application Note","article-title":"Understanding how to run timing-aware ATPG","year":"2006","key":"ref6"},{"year":"2007","key":"ref5","article-title":"SOLD Y-2007, Volumes 1, 2, 3"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700627"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.32"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.28"},{"key":"ref1","article-title":"Small Delay Defect Testing","author":"mattiuzzo","year":"2009","journal-title":"Test & Measurement World"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895771"},{"key":"ref20","first-page":"808","article-title":"Analytic Models for Crosstalk Delay and Pulse Analysis Undernon-Ideal Inputs","author":"chen","year":"1997","journal-title":"Proc IEEE International Test Conference (ITC'97)"},{"article-title":"Numerical Methods with MATLAB: Implementations and Applications","year":"2000","author":"recktenwald","key":"ref21"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457036.pdf?arnumber=5457036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T20:47:57Z","timestamp":1489870077000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457036","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}