{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T10:09:13Z","timestamp":1729678153438,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457042","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1462-1467","source":"Crossref","is-referenced-by-count":7,"title":["Soft error-aware design optimization of low power and time-constrained embedded systems"],"prefix":"10.1109","author":[{"given":"Rishad A","family":"Shafik","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bashir M","family":"Al-Hashimi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"251","DOI":"10.1145\/381677.381701","article-title":"Dynamic voltage scaling on a low-power micropro-cessor","author":"pouwelse","year":"2001","journal-title":"Proc 7th MobiCom"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2008.25"},{"key":"ref12","first-page":"145","article-title":"Soft error-aware voltage scaling technique for power minimization in application-specific MPSoC","volume":"5","author":"shafik","year":"2009","journal-title":"ASP JOLPE"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2007.01.013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.824302"},{"key":"ref3","first-page":"780","article-title":"Reliability-aware optimization for DVS-enabled realtime embedded systems","author":"dabiri","year":"2008","journal-title":"Proceedings of ISQED'08"},{"key":"ref6","first-page":"134","article-title":"Energy-aware computation duplication for improving reliability in embedded chip microprocessors","author":"chen","year":"2006","journal-title":"Proc of ASPDAC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.874355"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.116"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253723"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.50"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/PBCS018E"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1289816.1289873"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457042.pdf?arnumber=5457042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,29]],"date-time":"2023-06-29T12:46:18Z","timestamp":1688042778000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457042\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457042","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}