{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:56:33Z","timestamp":1747810593544},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457098","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"1755-1760","source":"Crossref","is-referenced-by-count":1,"title":["An automatic test generation framework for digitally-assisted adaptive equalizers in high-speed serial links"],"prefix":"10.1109","author":[{"given":"Mohamed","family":"Abbas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kwang-Ting Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yasuo","family":"Furukawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Satoshi","family":"Komatsu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kunihiro","family":"Asada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.14"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156405003259"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511607462"},{"key":"ref13","article-title":"Adaptive Digital Filters","author":"bellanger","year":"2001","journal-title":"Marcel Dekker Inc"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.33"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2008.65"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.842863"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.148325"},{"key":"ref18","article-title":"GA-Based Test Generation for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links","author":"abbas","year":"2009","journal-title":"7th IEEE EWDTS 2009"},{"key":"ref4","first-page":"332","article-title":"A 10Gb\/s Eye-Opening Monitor in 0.13 &#x00B5;m CMOS","author":"analui","year":"0","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.159"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845563"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297698"},{"key":"ref7","article-title":"External Loopback Testing Experiences with High Speed Serial Interfaces","author":"meixer","year":"2008","journal-title":"IEEE International Test Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.818569"},{"key":"ref1","first-page":"4","article-title":"Equalization in High-speed Communication Systems","author":"liu","year":"2004","journal-title":"IEEE Circuit and System Magazine"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364676"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457098.pdf?arnumber=5457098","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T16:07:51Z","timestamp":1489853271000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457098\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457098","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}