{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:04:13Z","timestamp":1730214253676,"version":"3.28.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457112","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"702-705","source":"Crossref","is-referenced-by-count":2,"title":["A compact digital amplitude modulator in 90nm CMOS"],"prefix":"10.1109","author":[{"given":"V","family":"Chironi","sequence":"first","affiliation":[]},{"given":"B","family":"Debaillie","sequence":"additional","affiliation":[]},{"given":"A","family":"Baschirotto","sequence":"additional","affiliation":[]},{"given":"J","family":"Craninckx","sequence":"additional","affiliation":[]},{"given":"M","family":"Ingels","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref3","first-page":"1948","article-title":"A 10-b 500MSamples\/s CMOS DAC in 06mm2","volume":"33","author":"lin","year":"1998","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref6","first-page":"373","article-title":"A Multi-Standard Digital EnvelopeModulator for Polar Transmitters in 90nm CMOS","author":"van zeijl","year":"2007","journal-title":"Radio Frequency"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.813290"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.905239"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2004338"},{"key":"ref1","first-page":"69","article-title":"System Requirents for OFDM Polar Transmitter","volume":"3","author":"talonen","year":"2005","journal-title":"Circuit Theory and Design"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457112.pdf?arnumber=5457112","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T15:17:25Z","timestamp":1489850245000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457112\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457112","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}