{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T16:59:33Z","timestamp":1725469173359},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457192","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"299-302","source":"Crossref","is-referenced-by-count":6,"title":["Timing modeling for digital sub-threshold circuits"],"prefix":"10.1109","author":[{"given":"Niklas","family":"Lotze","sequence":"first","affiliation":[]},{"given":"Jacob","family":"Goppert","sequence":"additional","affiliation":[]},{"given":"Yiannos","family":"Manoli","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.2006.4271799"},{"key":"ref3","first-page":"188","article-title":"The phoenix processor: A 30pw platform for sensor applications","author":"seok","year":"2008","journal-title":"Proc Symposium on VLSI Circuits"},{"key":"ref10","first-page":"62","article-title":"Statistical timing analysis using bounds","author":"agarwal","year":"2003","journal-title":"Proc DATE"},{"key":"ref6","first-page":"152","article-title":"Performance and variability optimization strategies in a sub-200mv, 3.5pj\/inst, l l nw subthreshold processor","author":"hanson","year":"2007","journal-title":"Proc Symposium on VLSI Circuits"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862751"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.2005.195479"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1233501.1233546"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803957"},{"key":"ref7","first-page":"318","article-title":"A 65nm sub-vt microcontroller with integrated sram and switched-capacitor dc-dc converter","author":"kwong","year":"0","journal-title":"Tech Dig ISSCC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837945"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159744"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2002.1016866"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457192.pdf?arnumber=5457192","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T20:48:02Z","timestamp":1489870082000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457192\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457192","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}