{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:32:43Z","timestamp":1729647163571,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457235","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:33Z","timestamp":1361279793000},"page":"57-62","source":"Crossref","is-referenced-by-count":2,"title":["Statistical SRAM analysis for yield enhancement"],"prefix":"10.1109","author":[{"given":"Paul","family":"Zuber","sequence":"first","affiliation":[]},{"given":"Miguel","family":"Miranda","sequence":"additional","affiliation":[]},{"given":"Petr","family":"Dobrovolny","sequence":"additional","affiliation":[]},{"given":"Koen","family":"van der Zanden","sequence":"additional","affiliation":[]},{"family":"Jong-Hoon Jung","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364475"},{"journal-title":"Response Surface Methodology Process and Product in Optimization Using Designed Experiments","year":"2002","author":"myers","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030351"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1983.1270035"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229167"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"907","DOI":"10.1109\/TCSII.2008.923411","article-title":"Numerical estimation of yield in sub-100-nm sram design using monte carlo simulation","volume":"55","author":"nho","year":"2008","journal-title":"Circuits and Systems II Express Briefs IEEE Transactions on"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810363"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref7","first-page":"660","article-title":"Yield-driven near-threshold sram design","author":"chen","year":"2007","journal-title":"Proc Intl Conf Computer-Aided Design"},{"key":"ref2","article-title":"Using exponent monte carlo for quick statistical circuit simulation","author":"zuber","year":"2009","journal-title":"Proc Int'l Workshop Power and Timing Modeling Optimization and Simulation"},{"key":"ref1","first-page":"87","author":"ott","year":"1999","journal-title":"Proc Advanced Semiconductor Manufacturing Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810353"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457235.pdf?arnumber=5457235","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T03:48:21Z","timestamp":1498016901000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457235\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457235","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}