{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:11:40Z","timestamp":1729671100285,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,3]]},"DOI":"10.1109\/date.2010.5457236","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:33Z","timestamp":1361297793000},"page":"63-68","source":"Crossref","is-referenced-by-count":0,"title":["Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme"],"prefix":"10.1109","author":[{"family":"Mingjing Chen","sequence":"first","affiliation":[]},{"given":"Alex","family":"Orailoglu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894222"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1109\/TCAD.2003.822103","volume":"23","author":"miyase","year":"2004","journal-title":"IEEE Trans on CAD"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144279"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159762"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855293"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484837"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2007.375221"},{"key":"ref8","first-page":"265","article-title":"On low-capture-power test generation for scan testing","author":"wen","year":"2005","journal-title":"Proc VTS"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843824"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271098"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/309847.310053"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.118"}],"event":{"name":"2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)","start":{"date-parts":[[2010,3,8]]},"location":"Dresden","end":{"date-parts":[[2010,3,12]]}},"container-title":["2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5450668\/5456897\/05457236.pdf?arnumber=5457236","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T07:48:21Z","timestamp":1498031301000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5457236\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/date.2010.5457236","relation":{},"subject":[],"published":{"date-parts":[[2010,3]]}}}