{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T10:20:27Z","timestamp":1756462827151},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/date.2011.5763015","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T22:45:16Z","timestamp":1361313916000},"page":"1-1","source":"Crossref","is-referenced-by-count":4,"title":["Logic synthesis and physical design: Quo vadis?"],"prefix":"10.1109","author":[{"given":"G","family":"De Micheli","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270347"},{"key":"ref3","article-title":"Synthesis and Optimization of Digital Systems","author":"de micheli","year":"0","journal-title":"MGH 94"},{"key":"ref6","first-page":"958","article-title":"Automated Design of Misaligned CNT Circuits","author":"patil","year":"0","journal-title":"Proc of DAC '07"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2042882"},{"key":"ref8","article-title":"CELONCEL","author":"bobba","year":"2011","journal-title":"Proc ASPDAC"},{"key":"ref7","article-title":"Regular Fabric Design with Ambipolar CNTFETs","author":"de marchi","year":"0","journal-title":"Proceedings Nanoarch ‘10"},{"key":"ref2","article-title":"Minimization of Digital Functions","author":"mccluskey","year":"1956","journal-title":"BSTJ"},{"journal-title":"Networks on Chips M Kaufmann","year":"2008","author":"de micheli","key":"ref9"},{"journal-title":"Design Automation of Digital Systems Prentice Hall","year":"1972","author":"breuer","key":"ref1"}],"event":{"name":"2011 Design, Automation & Test in Europe","start":{"date-parts":[[2011,3,14]]},"location":"Grenoble","end":{"date-parts":[[2011,3,18]]}},"container-title":["2011 Design, Automation & Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5754459\/5762992\/05763015.pdf?arnumber=5763015","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T08:53:13Z","timestamp":1490086393000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5763015\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2011.5763015","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}