{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:40:16Z","timestamp":1725435616402},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/date.2011.5763115","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T22:45:16Z","timestamp":1361313916000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["On diagnosis of multiple faults using compacted responses"],"prefix":"10.1109","author":[{"family":"Jing Ye","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yu Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xiaowei Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403730"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391567"},{"key":"ref12","first-page":"291","article-title":"Diagnosing DACS (Defects that Affect Scan Chain and System Logic)","author":"huang","year":"2004","journal-title":"Proc of International Symposium for Testing and Failure Analysis"},{"key":"ref13","article-title":"Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defect","author":"wang","year":"2008","journal-title":"Proc of International Test Conference (ITC)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232257"},{"key":"ref15","first-page":"1095","article-title":"Fault Detection and Diagnosis with Parity Trees for Space Compaction of Test Responses","author":"vranken","year":"2006","journal-title":"Proc of Design Automation Conference (DAC)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041774"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270904"},{"journal-title":"Built-In Self-Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.32"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/54.32421"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.816206"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041767"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref8","article-title":"An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis","author":"yu","year":"2008","journal-title":"Proc of International Test Conference (ITC)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297627"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.606006"},{"journal-title":"The International Technology Roadmap for Semiconductors","year":"2005","key":"ref1"},{"key":"ref9","first-page":"885","article-title":"Diagnosis of Multiple Arbitrary Faults with Mask and Reinforcement Effect","author":"ye","year":"2010","journal-title":"Proc of Design Automation and Test in Europe (DATE)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090875"},{"journal-title":"VLSI Test Principles and Architectures Design for Testability","year":"2006","author":"wang","key":"ref21"}],"event":{"name":"2011 Design, Automation & Test in Europe","start":{"date-parts":[[2011,3,14]]},"location":"Grenoble","end":{"date-parts":[[2011,3,18]]}},"container-title":["2011 Design, Automation & Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5754459\/5762992\/05763115.pdf?arnumber=5763115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:13:13Z","timestamp":1490087593000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5763115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/date.2011.5763115","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}