{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:05:09Z","timestamp":1730214309503,"version":"3.28.0"},"reference-count":38,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/date.2011.5763258","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T17:45:16Z","timestamp":1361295916000},"page":"1-6","source":"Crossref","is-referenced-by-count":5,"title":["Error prediction based on concurrent self-test and reduced slack time"],"prefix":"10.1109","author":[{"given":"V","family":"Gherman","sequence":"first","affiliation":[]},{"given":"J","family":"Massas","sequence":"additional","affiliation":[]},{"given":"S","family":"Evain","sequence":"additional","affiliation":[]},{"given":"Ste\u0301phane","family":"Chevobbe","sequence":"additional","affiliation":[]},{"given":"Y","family":"Bonhomme","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"ref38"},{"key":"ref33","first-page":"112","author":"tschanz","year":"2009","journal-title":"IEEE Symp VLSI Circuits"},{"journal-title":"Tandem Computers Incorporated","article-title":"NonStop Himalaya range: K200, K2000, and K20000 servers","year":"1995","key":"ref32"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/12.54848"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.54"},{"year":"0","key":"ref37"},{"key":"ref36","article-title":"A model for negative bias temperature instability (NBTI) in oxide and high K PFETs","author":"zafar","year":"2004","journal-title":"IEEE VLSI Technology and Circuits"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295104"},{"key":"ref34","article-title":"Uniprocessor performance enhancement through adaptive clock frequency control","author":"uht","year":"2003","journal-title":"SSGRR"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.990739"},{"key":"ref12","article-title":"VAST: Virtualization Assisted Concurrent Autonomous Self-Test","author":"hiroaki","year":"2008","journal-title":"IEEE Intl Test Conf"},{"journal-title":"ITRS","year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1013235.1013248"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090637"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243983"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584064"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1168857.1168868"},{"key":"ref4","first-page":"400","article-title":"Razor II: in situ error detection and correction for PVT and SER tolerance","author":"blaauw","year":"2008","journal-title":"ISSCC"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675011"},{"journal-title":"ARM","article-title":"AMBA™ Specification (Rev 2.0","year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref29","article-title":"Detecting emerging wearout faults","author":"smolens","year":"2007","journal-title":"Workshop on Silicon Errors in Logic - System Effects"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.556983"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.55"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197714"},{"key":"ref20","first-page":"43","article-title":"Robust system design with built-in soft-error resilieace","volume":"38","author":"mitra","year":"2005","journal-title":"Special Issue of Journal of Computer"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"ref21","article-title":"A four channel, self-calibrating high resolution TDC","author":"mota","year":"1998","journal-title":"IEEE Int Conf Electronics Circuits Systems"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1147\/rd.435.0875"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437666"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2005.62"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1366230.1366258"}],"event":{"name":"2011 Design, Automation & Test in Europe","start":{"date-parts":[[2011,3,14]]},"location":"Grenoble","end":{"date-parts":[[2011,3,18]]}},"container-title":["2011 Design, Automation & Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5754459\/5762992\/05763258.pdf?arnumber=5763258","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:08:46Z","timestamp":1490072926000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5763258\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/date.2011.5763258","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}