{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,31]],"date-time":"2025-05-31T05:06:48Z","timestamp":1748668008185},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/date.2011.5763283","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T22:45:16Z","timestamp":1361313916000},"page":"1-4","source":"Crossref","is-referenced-by-count":5,"title":["An LOCV-based static timing analysis considering spatial correlations of power supply variations"],"prefix":"10.1109","author":[{"given":"S","family":"Kobayashi","sequence":"first","affiliation":[]},{"given":"K","family":"Horiuchi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"254","article-title":"Critical path analysis considering temperature, power supply variations and temperature induced leakage","author":"li","year":"2006","journal-title":"Proc ISQED"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560095"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629949"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2013990"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.901574"},{"journal-title":"PrimeTime Advanced OCV Technology","year":"2009","key":"ref7"},{"key":"ref2","first-page":"652","article-title":"Worst-case circuit delay taking into account power supply variations","author":"kouroussis","year":"2004","journal-title":"Proceedings 41st Design Automation Conference 2004 DAC"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.114"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378489"}],"event":{"name":"2011 Design, Automation & Test in Europe","start":{"date-parts":[[2011,3,14]]},"location":"Grenoble","end":{"date-parts":[[2011,3,18]]}},"container-title":["2011 Design, Automation & Test in Europe"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5754459\/5762992\/05763283.pdf?arnumber=5763283","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:47:32Z","timestamp":1490075252000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5763283\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2011.5763283","relation":{},"subject":[],"published":{"date-parts":[[2011,3]]}}}