{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T19:12:08Z","timestamp":1729624328147,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176440","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:29Z","timestamp":1361279789000},"page":"99-104","source":"Crossref","is-referenced-by-count":6,"title":["Post-synthesis leakage power minimization"],"prefix":"10.1109","author":[{"given":"M.","family":"Rahman","sequence":"first","affiliation":[]},{"given":"C.","family":"Sechen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024829"},{"article-title":"Incre mental timing analysis","year":"1996","author":"abato","key":"14"},{"key":"11","doi-asserted-by":"crossref","first-page":"1014","DOI":"10.1109\/43.771182","article-title":"Fast and Exact Simultaneous Gate and Wire Sizing by Lagrangian Relaxation","volume":"18","author":"chen","year":"1999","journal-title":"IEEE Trans CAD"},{"key":"12","first-page":"198","article-title":"Potential Slack: An Efficient Metric of Combinational Circuit Performance","author":"chen","year":"0","journal-title":"Proc Int Conf on CAD 2000"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/92.994980"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/92.924061"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/92.748196"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763293"},{"key":"7","first-page":"705","article-title":"Discrete Vt Assignment and Gate Sizing Using a Self-Snapping Continuous Formulation","author":"shah","year":"0","journal-title":"Proc ICCAD Nov 2005"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120881"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.13"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167561"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035575"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/1393921.1393937"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176440.pdf?arnumber=6176440","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T03:48:09Z","timestamp":1498016889000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176440\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176440","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}